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Control 2017 Control Vision Talks for Machine Vision and Optical Metrology

The Control show organizer and the European Machine Vision Association (EMVA) continue their partnership and realize the second edition of the presentation forum "Control Vision Talks" during the 31th Control – International trade fair for quality assurance from 09–12 May 2017 in Stuttgart, Germany. 

These second Control Vision Talks will be held in Hall 6 / Booth 6529 during the first three show days and offer more than 35 presentations on applied machine vision and optical metrology for quality assurance in German and English language. Each of the days has a special thematic priority: 

  • Tuesday, 09 May: World of 3D: From 6-DoF to Point Cloud
  • Wednesday, 10 May: Optical Metrology: Offline – At line – Inline
  • Thursday, 11 May: Metrology throughout the whole spectrum: From Infrared to Hyperspectral

The Control Vision Talks aim to demonstrate the advantages of machine vision and optical metrology for quality assurance in an application-oriented manner. Trade fair visitors have free access to the presentations and do not need to register.

Labels: Control 2017,Control trade show,European Machine Vision Association,EMVA,machine vision,optical metrology

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