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The combined tools of ultrafast spectroscopy and nonlinear microscopy allow us to explore the diverse length and time scales of biology
The DLP2010NIR is featured in this DLP NIRscan Nano evaluation module from Texas Instruments
Summing Opportunities in TDI CMOS Sensor Architectures
A group of fruit flies were exposed to 670 nm radiation and their survival rate examined over a period of twelve weeks Photo courtesy of USGS Bee Inventory and Monitoring Lab

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