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EMVA at measurement forum

EMVA announced that it will contribute to the machine vision presence during the exhibition Measurement World with a presentation forum. The new biannual exhibition format Measurement World is dedicated to measurement in its broadest sense and takes place from September 24 – 26 in hall 4 at Paris Expo Port de Versailles. The machine vision presentations are given in French or English and free of charge for all visitors and will be held on Tuesday, 24 September from 2.00 pm – 5.00 pm and on Wednesday, 25 September from 9.30 am – 12.00 pm in ROOM 1 of hall 4.

Presentation topics include state of the art vision technology; the description of concrete machine vision applications in different industrial sectors; machine vision standards and their objectives as well as the description of the vision markets in France, in Europe and worldwide. Below the timetable including the presentation titles:

Tuesday, 24 September

14:00 – 14:30

EMVA: Presentation and numbers

Jean CARON – Michel OLLIVIER – Members of the EMVA Board

14:30 – 15:00

State of the art of visible Machine Vision sensors

Yvan EILERS - SVS-VISTEK

15:00 - 15:30

Artificial Intelligence on edge devices for machine vision applications

Boris DUCHE - IDS

15:30 – 16:00

Illumination techniques for new vision applications (Hyperspectral, SWIR, 3D…)

Arnaud MESTIVIER – EFFILUX

16:00 – 16:30

How to use the Sony polarized camera technology for complex applications and open new fields for inspection?

Pascal CHEVALIER – I2S / Stéphane CLAUSS – SONY

16:30 – 17:00

Embedded vision : from optimization to miniaturization, key factors to succeed in the development of your applications 

Elodie Rigaudiere / TECHWAY

Wednesday, 25 September

9:30 – 10:00

EMVA: Machine Vision standards

Jean CARON – Michel OLLIVIER – Members of the EMVA Board

10:00 – 10:30

Multiple object tracking, a challenge for machine vision

Romain BAUDE – APREX SAS

10:30 - 11:00

How to innovate and create value with public research?

Rodolphe BERNARD – INSAVALOR

11:00 – 11:30

Expand the reach of your inspection systems with infrared imaging technologies

Sébastien FRASSE-SOMBET – LYNRED (SOFRADIR/ULIS)

11:30 – 12:00

XRAY tomography services the industrial world

Laura CREON - SEMATEC

EMVA members at Measurement World

Several EMVA members will exhibit at Measurement World with their own booths. These are ATD Electronique, Carl Zeiss, Edmund Optics GmbH, EFFILUX, IDS – Imaging Development Systems, Mettler Toledo, Precitec, Stemmer Imaging, SVS Vistek, and VS Technology. Furthermore, in addition to their trade fair booth ATD Electronique announced that the company offers its own conference program. More details on the program and how to register can be found on their websites www.atdelectronique.com/event-shows.

Labels: EMVA,machine vision,measurement,artificial intelligence,tomography,inspection,miniaturization

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