Bruker launched the scalable ContourGT-K 3D optical microscope for bench-top metrology. Incorporating many of the features of Bruker’s flagship optical metrology products, the ContourGT-K delivers unsurpassed z-axis resolution across all fields of view and 2D/3D imaging capability for non-contact profile, roughness and thickness measurements on a wide range of surfaces. The system’s gauge-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments. The new ContourGT-K also incorporates the latest version of Bruker’s Vision64 software and a library of pre-programmed filters and analyses for easy access to advanced measurements for: light-emitting diode (LED), solar cell, thick film, semiconductor, ophthalmic, medical device, micro-electro-mechanical system (MEMS) and tribology (i.e., the science and engineering of interacting surfaces in relative motion) applications.
The ContourGT-K is the latest addition to Bruker’s ContourGT line of 3D optical microscopes. With surface characterisation and 2D/3D measurement, as well as high-resolution imaging capabilities, this new system offers metrology in a simplified, compact package. The ContourGT-K features patented, high-brightness dual-LED illumination and vertical resolution that greatly improves sensitivity and stability. Intuitive Vision64 software provides the easiest to use interface and most powerful measurement and analysis software. The system’s options bring both flexibility for additional application needs and continual advancement of metrology capabilities as needs and budgets increase.
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