At the 2012 Materials Research Society (MRS) Fall Meeting currently in progress (on 25-30 November 2012 at the Hynes Convention Center in Boston, Massachusetts, US), Bruker announced two new products: the NanoLens Atomic Force Microscope (AFM) accessory for ContourGT 3D optical microscopes and a new line of IRIS Tip-Enhanced Raman Spectroscopy (TERS) Probes.
• The NanoLens AFM accessory for ContourGT 3D optical microscopes was designed for fast installation on a new five-position, fully automated turret. The compact NanoLens delivers high-resolution imaging capabilities without sacrificing measurement speed in optical modes. With NanoLens, users can perform nanometer-scale surface and material property analysis on the same system that provides repeatable and versatile 3D optical microscopy measurements. (For more details on the ContourGT, see the article “Bruker Releases 3D Optical Microscope System” on Novus Light Technologies Today.)
Bruker Innova-IRIS TERS System
• The IRIS TERS probe tips provide users with a path to non-destructive, label-free chemical detection at the nanoscale level. As sharp solid-metal cones, IRIS TERS Probes are designed to deliver high Raman enhancement, which translates to high sensitivity and spatial resolution. Together with Bruker’s Innova-IRIS system and third-party research Raman systems, IRIS TERS Probes can create a complete commercial high-performance TERS solution, removing the need for TERS researchers to be their own TERS tip fabrication experts
IRIS TERS Probes are fully compatible with the company’s Innova-IRIS systems. These systems require only a new cartridge to start using them immediately and any existing Innova can be upgraded to an Innova-IRIS AFM-Raman system. Utilized on the Innova-IRIS system, the IRIS TERS Probes enable TERS on opaque samples using scanning tunneling microscopy (STM) feedback. Being made of solid gold, the IRIS TERS Probes are optimized for high TERS enhancement at red and near-infrared (NIR) Raman excitation wavelengths.
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