A new reflectometer system from Gamma Scientific is what the company reports to be the first commercially available instrument to deliver high speed, automated reflectance measurements of glass for display and architectural uses, designed for use in a production setting. Specifically, the Dual Angle Reflectance Measurement System provides ±0.05% accuracy, and includes built-in second surface reflection suppression that can now eliminate measurement errors on glass as thin as 0.3 mm. Plus, built-in self-calibration enables the Dual Angle Reflectance Measurement System to consistently produce high accuracy data, even when being used by untrained personnel in harsh environments.
The Dual Angle Reflectance Measurement System comprises two optical heads and spectrometers, all housed in a dark enclosure that enables measurements in high ambient light, production environments. The measurement head uses motorized positioners to rapidly acquire any number of desired data points on substrates as large 0.4 m x 0.4 m, and automatically acquires correct focus at the glass surface through the use of a laser-based height sensor. In just milliseconds, the system obtains simultaneous reflectance measurements at both 10° and 45° incidence angles over the entire 380 – 1100 nm spectral range. All instrument control and data acquisition hardware and software are included with the system.
Measured data can be reported in a wide variety of formats. These include plots of reflectance as a function of wavelength, CIE color coordinates for gauging coating visual appearance, simple pass/fail criteria, and statistical data trends. In addition to pure colorimetric binning, measurements can be analyzed relative to other substrate positions for uniformity and color difference judgement criteria. As an added bonus, the auto-focus height adjustment also measures and reports the substrate flatness profile with micron-level accuracy. Data can be logged in multiple formats and included in a searchable SQL database server. By using these reflectance measurements results, together with the system’s integrated film thickness analysis tool, directly into the production line feedback control, higher yields and more consistent coating uniformity on the glass or other substrates can be achieved.
Gamma Scientific, based in San Diego, California (US), provides a range of light measurement solutions for manufacturers and users of light sources, sensors and displays. Products include high precision spectroradiometers, goniophotometers, integrating spheres, thin film measurement systems, calibration light sources, and LED testers and sorters. The company also operates an ISO 17025, NVLAP accredited laboratory (NVLAP Laboratory code 200823-0) for calibration and testing.
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