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Sensofar S Wide

Sensofar Metrology announced the release of the next metrology tool for wide areas. The S wide is a high-performance non-contact 3D optical large area metrology system designed for microscale measurement, with advanced inspection and analysis capabilities.

The S wide is a dedicated solution designed to rapidly measure large sample areas up to 300 x 300 mm (11.8 x 11.8 in). It provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. Extremely easy-to-use with one button data acquisition.

The most significant features are: One shot height measurement up to 40 mm without Z-scanning. Sub-micron height repeatability over entire extended area. Form deviation from 3D CAD models (providing the geometric difference and tolerance measurement). Bi-telecentric lenses with very low field distortion providing accurate metrology. The S wide is intended to the following solutions: 

Archaeology & Paleontology Consumer electronics Medical devices Molding Optics Watch industry The S wide is ideal for all lab environments, without limitations and as sensor in production areas. Every S wide is manufactured to deliver accurate and traceable measurements. Systems are calibrated and traceable according to the ISO 25178 and VDI2634-2 standards.

The S wide comes with SensoSCAN which drives the system with a clear, intuitive and user-friendly interface and is coupled with new software SensoVIEW for a broad range of analysis tasks. Automated analysis modules have been created to make all QC procedures easier with SensoPRO. Further details can be found at The S wide system will be premiered at the upcoming webinar (April 8, 2020): 

 Broad the Limits with the New Sensofar System S wide 

Labels: Sensofar Metrology,S-wide,digital microscopy,measurement

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