On 1 January, Zeev Zalevsky, dean of Faculty of Engineering at Bar-Ilan University and director of the Nano-Photonics Center at the University's Institute of Nanotechnology and Advanced Materials (BINA), will become the new editor-in-chief (EIC) of the Journal of Electronic Imaging (JEI). He succeeds the journal's current editor-in-chief, Karen Egiazarian, who has served since 2016.
Co-published by the Society for Imaging Science and Technology (IS&T) and SPIE, the international society for optics and photonics, JEI covers technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems. It is one of 12 journals published by SPIE in the SPIE Digital Library and one of three IS&T journals.
"The EIC role is highly important to me as it gives me the opportunity to give back to the community and to the relevant professional societies that enriched me during my years of studies and of being a young researcher," says Zalevsky. "I am looking forward to working for the journal and doing my best to increase its scientific impact and international footprint while bringing together researchers from all around the world, especially young and promising researchers."
"As our candidate of choice for the Journal of Electronic Imaging, incoming editor-in-chief Zeev Zalevsky has been selected from a highly competitive field," notes Chair of the SPIE Publications Committee David Sampson. "Zeev brings an impressive breadth of experience and gravitas to the role that will ensure the continued success of this joint venture between SPIE and IS&T. His experience and achievements from academia to the commercial world will ensure JEI continues to remain as relevant today as when it was founded."
"Zeev Zalevsky's energy around imaging and optics was clearly evident throughout the selection process," states IS&T Publications Vice President Robin Jenkin. "His awareness of developments in fields beyond his own, combined with experience across both academia and industry, are matched by a desire to improve education and communication within the field. IS&T is delighted to join SPIE in appointing Zeev as editor-in-chief of JEI, where his leadership will make certain the journal continues to serve and inform the international community during this unprecedented period of growth and development of imaging worldwide."
A Fellow of both IS&T and SPIE — as well as several other professional societies — Zalevsky serves on the SPIE conference program committees for Optical Systems Design, Optical Metrology, Defense + Commercial Sensing, and BiOS. He is also an instructor for the SPIE course "Super Resolution and Extended Depth of Focus." He received his doctorate in electrical engineering from Tel Aviv University in 1996 and has founded multiple optical startups since then. Zalevsky's areas of research interest include super resolution, the generation and manipulation of light for use in ultra-small applications for high-speed information processing and biological sensing. Through his commercial enterprises, he has developed a next-generation remote biosensor for vital signs, a disposable ultra-thin endoscope, special optical fibers for communication networks and medical diagnosis, and more. In recognition for his research, Zalevsky has received many national and international awards, including the Krill Prize, the International Commission for Optics (ICO) Prize, the Erlangen Graduate School in Advanced Optical Technologies (SAOT) Young Researcher Award, an IS&T Image Engineering Innovation Award, and an SPIE Prism Award.
Founded in 1947, the Society for Imaging Science and Technology is an international not-for-profit organization dedicated to expanding knowledge and expertise through conferences, webinars, short courses, and publications, and leads efforts to set international imaging standards as Secretariate of ISO TC 42. IS&T encompasses all aspects of imaging, from input (vision, sensors) through processing to output (display, hardcopy), with particular emphasis on advanced imaging technologies; color science; cultural heritage digitization; digital printing; and associated applications. .